TGG1
200,00 €
zzgl. MwSt., zzgl. Versand
Nicht auf Lager
Lieferzeit: 20 Tag(e)Beschreibung
Calibration grating TGG1 is intended for:
- AFM calibration in X or Y axis
- detection of lateral and vertical scanner nonlinearity
- detection of angular distortion
- tip characterization
Specification
- Structure: the grating is formed on Si wafer top surface
- Pattern type: 1- D array of triangular steps (in X or Y direction) having precise linear and angular sizes
- Edge angle: 70 degrees
- Edge radius: ≤ 10 nm
- Period: 3 ± 0,05 µm
- Chip size: 5 x 5 x 0,5 mm
- Effective area: central square 3 x 3 mm
- Producer: TipsNano