TDG01

300,00 €

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Nicht auf Lager

Lieferzeit: 20 Tag(e)

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Beschreibung

Calibration grating TDG01 is intended for AFM submicron calibration in X or Y direction. Period is 278nm.

Specifications

Structure: the grating is formed on the chalcogenide glass coated by Al
Pattern type: parallel ridges in X or Y direction, 1-Dimensional
Pattern height: > 55 nm
Period: 278 ± 1 nm
Chip size: diameter 12,5 mm, thickness - 2,5 mm
Effective area: central diameter 9 mm
Producer: TipsNano